The voltage limit is a critical piece of the safety system that protects your laser. When the voltage limit is exceeded, your laser driver should power down immediately. In powering down, the laser driver accomplishes two things. First, it protects against excessive voltage. Second, it responds to an open circuit condition before the circuit can be accidentally closed, which would allow a massive current spike.
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Not all power sources and laser drivers have a voltage limit, so verify this feature before making a purchase.
In contrast to the voltage limits, the current limit need not power down your system. Instead, your laser diode driver should treat the current limit as a maximum value that it will not exceed. It is especially important to have your current limit set to a reasonable value when you are powering on your laser system for the first time, when you are controlling the laser with a modulated signal, and particularly whenever operating in constant power control (as described in the next point).
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The TESCAN SX is a versatile instrument for the characterization of materials. It combines a plasma-source focused ion beam microscope and a high- resolution (BrightBeam) scanning electron microscope. The FIB microscope is equipped with a Xe+ ion plasma source and will include additional gases in the near future. The Xe plasma can generate a focused beam up to 1 uA, which allows very high milling rates (up to 50X faster than the prior Ga+ ion technology) and does not lead to deleterious ion implantation in the same way that Ga+ ions do. The BrightBeam SEM is a field-free, ultra-high resolution electron microscope whose optics allow improved resolution, even at low energies. This improves imaging of non-conducting samples. The instrument is equipped with advanced analytical capabilities, as well. These include a Time-of-Flight Secondary Ion Mass Spectrometery (ToF-SIMS) that can detect the ions emitted from the sample, allowing chemical characterization. ToF-SIMS is especially useful in detecting light elements, including the discrimination of hydrogen and deuterium. An Energy Dispersive x-ray spectrometer (EDS) allows for additional, complementary chemical characterization. The SX is also equipped with a cryogenic stage and a sample transfer loadlock, allowing work down to -160 C or introduction of frozen samples into the tool to be milled. A cryogenic Kleindiek nanomanipulator enables users to interact with the sample in-situ as well as lift-out frozen sections for subsequent TEM analysis.
This instrument was purchased with support from a National Science Foundations&#; Major Research Instrumentation grant (NSF MRI #). Additional support from the Laboratory for Research on the Structure of Matter (University of Pennsylvania Materials Research Science and Engineering Center (MRSEC) (DMR-).Go to Page
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